TY - GEN
T1 - Unified modeling for memristive devices based on charge-flux constitutive relationships
AU - Zheng, Le
AU - Shin, Sangho
AU - Kang, Sung Mo Steve
PY - 2013
Y1 - 2013
N2 - A unified modeling approach is proposed to cover a broad range of memristive devices. The modular structure of the model enables it to represent behaviors of different types of devices. Resulted from theoretical analyses, the window function is uniquely controlled by the memristive flux. This not only solves the stability problem at boundaries present in previous models, but also reveals that an equivalent charge-flux constitutive relationship can be obtained from various types of memristive devices. Simulations on three device examples show that our model exhibits the device properties such as the frequency-dependent hysteresis, the limited memductance switching range with boundary assurances, the linear/nonlinear dopant drift, and the threshold voltages for read/write mode.
AB - A unified modeling approach is proposed to cover a broad range of memristive devices. The modular structure of the model enables it to represent behaviors of different types of devices. Resulted from theoretical analyses, the window function is uniquely controlled by the memristive flux. This not only solves the stability problem at boundaries present in previous models, but also reveals that an equivalent charge-flux constitutive relationship can be obtained from various types of memristive devices. Simulations on three device examples show that our model exhibits the device properties such as the frequency-dependent hysteresis, the limited memductance switching range with boundary assurances, the linear/nonlinear dopant drift, and the threshold voltages for read/write mode.
UR - http://www.scopus.com/inward/record.url?scp=84883374236&partnerID=8YFLogxK
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U2 - 10.1109/ISCAS.2013.6571820
DO - 10.1109/ISCAS.2013.6571820
M3 - Conference contribution
AN - SCOPUS:84883374236
SN - 9781467357609
T3 - Proceedings - IEEE International Symposium on Circuits and Systems
SP - 213
EP - 216
BT - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
T2 - 2013 IEEE International Symposium on Circuits and Systems, ISCAS 2013
Y2 - 19 May 2013 through 23 May 2013
ER -