Abstract
We present a systematic study of the surface resistance of perovskite thin films and bulk samples at microwave frequencies. The d.c. resistivity p of the various samples spans three orders of magnitude. For bulk samples, we obtain the usual ρ1/2 dependence of Rs. For ρ < 1 μΩ cm, Rs displays conventional behavior, i.e. Rs α ρ. However, for ρ > 1 μΩ cm, Rs is not proportional to ρ but to the conductivity σ. Using this fact, we have made the first direct observation of a peak in σ1, just below Tc in a-axis films of YBa2Cu3O7.
Original language | English (US) |
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Pages (from-to) | 256-261 |
Number of pages | 6 |
Journal | Thin Solid Films |
Volume | 288 |
Issue number | 1-2 |
DOIs | |
State | Published - Nov 15 1996 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry