Structural and ferromagnetic resonance characteristics of BaFe12O19 films with minimal linewidths

L. V. Saraf, Samuel Lofland, A. V. Cresce, S. M. Bhagat, R. Ramesh

Research output: Contribution to journalArticle

14 Scopus citations

Abstract

Ferromagnetic resonance (FMR) and structural characteristics of BaFe12O19 films with minimal linewidths were discussed. These films were deposited on (0001) oriented alumina using optimized growth, annealing conditions, and pulsed laser deposition. Measurement of x-ray diffraction, Rutherford backscattering, magnetization, atomic force microscopy and FMR at 58 GHz was done for characterization of the films. It was shown that the intrinsic high frequency losses can be attained in these adequately annealed films, deposited on alumina by pulsed laser deposition.

Original languageEnglish (US)
Pages (from-to)385-387
Number of pages3
JournalApplied Physics Letters
Volume79
Issue number3
DOIs
StatePublished - Jul 16 2001

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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