Skip to main navigation
Skip to search
Skip to main content
Rowan University Home
Home
Profiles
Research units
Core Facilities
Grants/Projects
Research Output
Prizes
Press/Media
Search by expertise, name or affiliation
Resistance transients in thin-film noise data
Linda M. Head
Research output
:
Contribution to conference
›
Paper
›
peer-review
2
Scopus citations
Overview
Fingerprint
Fingerprint
Dive into the research topics of 'Resistance transients in thin-film noise data'. Together they form a unique fingerprint.
Sort by
Weight
Alphabetically
Keyphrases
Noisy Data
100%
Metallization
100%
Noise Fluctuation
50%
Thin Metal Films
50%
Damage Process
50%
Noise Measurement
50%
Accelerated Life Test
50%
Abrupt Change
50%
Measurement System
50%
Low-level Noise
50%
Fourier Analysis
50%
Spectral Analysis
50%
Detection System
50%
Resistance to Change
50%
VLSI Interconnects
50%
Medicine and Dentistry
Urination
100%
Noise Measurement
50%
Spectroscopy
50%
Lifespan
50%
Engineering
Transients
100%
Metallizations
40%
Measurement System
20%
Resistance Change
20%
Interconnects
20%
Damage Process
20%
Measurement Noise
20%
Material Science
Metal Film
100%
Chemical Engineering
Metallizing
100%