Representative layer theory for diffuse reflectance

Donald J. Dahm; Kevin D. Dahm

doi:10.1366/0003702991947298

Representative layer theory for diffuse reflectance

Donald J. Dahm, Kevin D. Dahm

Research output: Contribution to journal › Article › peer-review

27 Scopus citations

Abstract

The fractions of light absorbed by and remitted from samples consisting of different numbers of plane parallel layers are related using a statistical equations. The resulting absorption/remission function, being independent of sample thickness, is a material property in the same sense as is the linear absorption coefficient in transmission spectroscopy. The absorption and remission coefficients are obtained by extrapolating the measured absorption and remission fractions for real layers to the fractions absorbed and remitted by a hypothetical layer.

Original language	English (US)
Pages (from-to)	647-654
Number of pages	8
Journal	Applied Spectroscopy
Volume	53
Issue number	6
DOIs	https://doi.org/10.1366/0003702991947298
State	Published - Jun 1999

All Science Journal Classification (ASJC) codes

Instrumentation
Spectroscopy

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10.1366/0003702991947298

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title = "Representative layer theory for diffuse reflectance",

abstract = "The fractions of light absorbed by and remitted from samples consisting of different numbers of plane parallel layers are related using a statistical equations. The resulting absorption/remission function, being independent of sample thickness, is a material property in the same sense as is the linear absorption coefficient in transmission spectroscopy. The absorption and remission coefficients are obtained by extrapolating the measured absorption and remission fractions for real layers to the fractions absorbed and remitted by a hypothetical layer.",

author = "Dahm, {Donald J.} and Dahm, {Kevin D.}",

year = "1999",

month = jun,

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publisher = "Society for Applied Spectroscopy",

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AB - The fractions of light absorbed by and remitted from samples consisting of different numbers of plane parallel layers are related using a statistical equations. The resulting absorption/remission function, being independent of sample thickness, is a material property in the same sense as is the linear absorption coefficient in transmission spectroscopy. The absorption and remission coefficients are obtained by extrapolating the measured absorption and remission fractions for real layers to the fractions absorbed and remitted by a hypothetical layer.

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DO - 10.1366/0003702991947298

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JO - Applied Spectroscopy

JF - Applied Spectroscopy

IS - 6

ER -

Representative layer theory for diffuse reflectance

Abstract

All Science Journal Classification (ASJC) codes

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