Representative layer theory for diffuse reflectance

Donald J. Dahm, Kevin D. Dahm

    Research output: Contribution to journalArticlepeer-review

    25 Scopus citations

    Abstract

    The fractions of light absorbed by and remitted from samples consisting of different numbers of plane parallel layers are related using a statistical equations. The resulting absorption/remission function, being independent of sample thickness, is a material property in the same sense as is the linear absorption coefficient in transmission spectroscopy. The absorption and remission coefficients are obtained by extrapolating the measured absorption and remission fractions for real layers to the fractions absorbed and remitted by a hypothetical layer.

    Original languageEnglish (US)
    Pages (from-to)647-654
    Number of pages8
    JournalApplied Spectroscopy
    Volume53
    Issue number6
    DOIs
    StatePublished - Jun 1999

    All Science Journal Classification (ASJC) codes

    • Instrumentation
    • Spectroscopy

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