Representative layer theory for diffuse reflectance

Donald J. Dahm, Kevin D. Dahm

Research output: Contribution to journalArticlepeer-review

31 Scopus citations

Abstract

The fractions of light absorbed by and remitted from samples consisting of different numbers of plane parallel layers are related using a statistical equations. The resulting absorption/remission function, being independent of sample thickness, is a material property in the same sense as is the linear absorption coefficient in transmission spectroscopy. The absorption and remission coefficients are obtained by extrapolating the measured absorption and remission fractions for real layers to the fractions absorbed and remitted by a hypothetical layer.

Original languageEnglish (US)
Pages (from-to)647-654
Number of pages8
JournalApplied Spectroscopy
Volume53
Issue number6
DOIs
StatePublished - Jun 1999

All Science Journal Classification (ASJC) codes

  • Instrumentation
  • Spectroscopy

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