Relating elastic modulus to indentation response using atomic force microscopy

M. R. VanLandingham, S. H. McKnight, G. R. Palmese, R. F. Eduljee, J. W. Gillespie, R. L. McCullough

Research output: Contribution to conferencePaperpeer-review

Abstract

In this work, an atomic force microscope (AFM) has been used to probe the mechanical properties of polymer samples through examination of force curves produced during tip-sample contact and indentation. Three types of cantilever probes with spring constants estimated to be 0.5-0.6 N/m, 2-3 N/m and 40-60 N/m, respectively, were used to study different polymer samples with known modulus values ranging from 0.5 MPa to 3 GPa. A methodology is developed that (1) relates the elastic modulus of the sample to the sample response measured using AFM force curves; and (2) illuminates the importance of the relative stiffnesses of the cantilever probe and the sample to the determination of elastic modulus.

Original languageEnglish (US)
Pages635-644
Number of pages10
StatePublished - 1996
Externally publishedYes
EventProceedings of the 1996 11th Technical Conference of the American Society for Composites - Atlanta, GA, USA
Duration: Oct 7 1996Oct 9 1996

Conference

ConferenceProceedings of the 1996 11th Technical Conference of the American Society for Composites
CityAtlanta, GA, USA
Period10/7/9610/9/96

All Science Journal Classification (ASJC) codes

  • Chemical Engineering(all)
  • Chemical Engineering (miscellaneous)
  • Building and Construction
  • Polymers and Plastics

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