The in-plane longitudinal resistivities of YBa2Cu3O7-δ (YBCO) films before and after Sn ion irradiation of a matching field 1 T have been measured as a function of magnetic field H (≤ 6 T) and temperature T. The extracted fluctuation part of the conductivity σxx*(T, H) of the unirradiated sample with inherent random disorder exhibits 3D-XY scaling behavior that reveals dynamic critical exponent z = 1.86 ± 0.1 and v ≈ 0.669. The inherent random disorder increases the dynamic critical exponent z to 1.86 ± 0.1 from the value of 1.5 that is for detwinned YBCO single crystal. After the irradiation, the fluctuation conductivity enhanced by the strong pinning of vortex shows deviation from the scaling behavior for the unirradiated one, suggesting that the critical dynamics is strongly perturbed by the strong pinning due to columnar defects.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Energy Engineering and Power Technology
- Electrical and Electronic Engineering