Nanoscale indentation of polymer systems using the atomic force microscope

M. R. Vanlandingham; S. H. Mcknight; G. R. Palmese; J. R. Elings; X. Huang; T. A. Bogetti; R. F. Eduljee; J. W. Gillespie

doi:10.1080/00218469708010531

Nanoscale indentation of polymer systems using the atomic force microscope

M. R. Vanlandingham
, S. H. Mcknight
, G. R. Palmese
, J. R. Elings
, X. Huang
, T. A. Bogetti
, R. F. Eduljee
, J. W. Gillespie

Research output: Contribution to journal › Article › peer-review

159 Scopus citations

Abstract

The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N/m were used to investigate a number of polymer systems, including an elastomer, several polyurelhane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.

Original language	English (US)
Pages (from-to)	31-59
Number of pages	29
Journal	Journal of Adhesion
Volume	64
Issue number	1-4
DOIs	https://doi.org/10.1080/00218469708010531
State	Published - 1997
Externally published	Yes

All Science Journal Classification (ASJC) codes

General Chemistry
Mechanics of Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

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10.1080/00218469708010531

Cite this

@article{3365e48e73ce41e39d7f4390d29c3de7,

title = "Nanoscale indentation of polymer systems using the atomic force microscope",

abstract = "The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N/m were used to investigate a number of polymer systems, including an elastomer, several polyurelhane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.",

author = "Vanlandingham, \{M. R.\} and Mcknight, \{S. H.\} and Palmese, \{G. R.\} and Elings, \{J. R.\} and X. Huang and Bogetti, \{T. A.\} and Eduljee, \{R. F.\} and Gillespie, \{J. W.\}",

note = "Funding Information: The authors gratefully acknowledge the support of the U. S. Army Research Laboratory (ARL) under the Composite Materials Research Collaborative Program (CMRCP), ARL agreement number DAALO1-96-2-0048. Also, the authors at the University of Delaware appreciate the close interactions with scientists and engineers at Digital Instruments which continue to play a large role in the development of this technique.",

year = "1997",

doi = "10.1080/00218469708010531",

language = "English (US)",

volume = "64",

pages = "31--59",

journal = "Journal of Adhesion",

issn = "0021-8464",

publisher = "Taylor and Francis Ltd.",

number = "1-4",

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TY - JOUR

T1 - Nanoscale indentation of polymer systems using the atomic force microscope

AU - Vanlandingham, M. R.

AU - Mcknight, S. H.

AU - Palmese, G. R.

AU - Elings, J. R.

AU - Huang, X.

AU - Bogetti, T. A.

AU - Eduljee, R. F.

AU - Gillespie, J. W.

N1 - Funding Information: The authors gratefully acknowledge the support of the U. S. Army Research Laboratory (ARL) under the Composite Materials Research Collaborative Program (CMRCP), ARL agreement number DAALO1-96-2-0048. Also, the authors at the University of Delaware appreciate the close interactions with scientists and engineers at Digital Instruments which continue to play a large role in the development of this technique.

PY - 1997

Y1 - 1997

N2 - The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N/m were used to investigate a number of polymer systems, including an elastomer, several polyurelhane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.

AB - The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N/m were used to investigate a number of polymer systems, including an elastomer, several polyurelhane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.

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DO - 10.1080/00218469708010531

M3 - Article

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SN - 0021-8464

VL - 64

SP - 31

EP - 59

JO - Journal of Adhesion

JF - Journal of Adhesion

IS - 1-4

ER -

Nanoscale indentation of polymer systems using the atomic force microscope

Abstract

All Science Journal Classification (ASJC) codes

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