Abstract
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N/m were used to investigate a number of polymer systems, including an elastomer, several polyurelhane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.
Original language | English (US) |
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Pages (from-to) | 31-59 |
Number of pages | 29 |
Journal | Journal of Adhesion |
Volume | 64 |
Issue number | 1-4 |
DOIs | |
State | Published - 1997 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- General Chemistry
- Mechanics of Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Materials Chemistry