Nanoscale indentation of polymer systems using the atomic force microscope

M. R. Vanlandingham, S. H. Mcknight, G. R. Palmese, J. R. Elings, X. Huang, T. A. Bogetti, R. F. Eduljee, J. W. Gillespie

Research output: Contribution to journalArticlepeer-review

156 Scopus citations

Abstract

The use of the atomic force microscope (AFM) to measure surface forces has been developed to optimize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation and would be ideal for the evaluation of multi-component polymer systems, such as adhesives and composites. In this paper, previous work related to the development of the AFM as a nanoindentation device is reviewed, and a technique is proposed which allows the AFM to be used to probe local stiffness changes in polymer systems. Cantilever probes with spring constants ranging from 0.4-150 N/m were used to investigate a number of polymer systems, including an elastomer, several polyurelhane systems, thermally cured epoxies, a thermoplastic polymer-thermosetting polymer adhesive system, and a thermoplastic matrix composite.

Original languageEnglish (US)
Pages (from-to)31-59
Number of pages29
JournalJournal of Adhesion
Volume64
Issue number1-4
DOIs
StatePublished - 1997
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Chemistry
  • Mechanics of Materials
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films
  • Materials Chemistry

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