Multimode quantitative scanning microwave microscopy of insitu grown epitaxial Ba1-xSrxTiO3 composition spreads

K. S. Chang, M. Aronova, O. Famodu, I. Takeuchi, S. E. Lofland, J. Hattrick-Simpers, H. Chang

Research output: Contribution to journalArticlepeer-review

54 Scopus citations

Abstract

We have performed variable-temperature multimode quantitative microwave microscopy of in situ epitaxial Ba1-xSrxTiO3 thin-film composition spreads fabricated on (100) LaA1O3 substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO3 to SrTiO3. We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba1-xSrxTiO3 at microwave frequencies.

Original languageEnglish (US)
Pages (from-to)4411-4413
Number of pages3
JournalApplied Physics Letters
Volume79
Issue number26
DOIs
StatePublished - Dec 24 2001

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

Fingerprint

Dive into the research topics of 'Multimode quantitative scanning microwave microscopy of insitu grown epitaxial Ba1-xSrxTiO3 composition spreads'. Together they form a unique fingerprint.

Cite this