Multimode quantitative scanning microwave microscopy of insitu grown epitaxial Ba1-xSrxTiO3 composition spreads

K. S. Chang; M. Aronova; O. Famodu; I. Takeuchi; S. E. Lofland; J. Hattrick-Simpers; H. Chang

doi:10.1063/1.1427438

Multimode quantitative scanning microwave microscopy of insitu grown epitaxial Ba_1-xSr_xTiO₃ composition spreads

K. S. Chang, M. Aronova, O. Famodu, I. Takeuchi, S. E. Lofland, J. Hattrick-Simpers, H. Chang

Physics

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56 Scopus citations

Abstract

We have performed variable-temperature multimode quantitative microwave microscopy of in situ epitaxial Ba_1-xSr_xTiO₃ thin-film composition spreads fabricated on (100) LaA1O₃ substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO₃ to SrTiO_3. We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba_1-xSr_xTiO₃ at microwave frequencies.

Original language	English (US)
Pages (from-to)	4411-4413
Number of pages	3
Journal	Applied Physics Letters
Volume	79
Issue number	26
DOIs	https://doi.org/10.1063/1.1427438
State	Published - Dec 24 2001

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.1427438

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title = "Multimode quantitative scanning microwave microscopy of insitu grown epitaxial Ba1-xSrxTiO3 composition spreads",

abstract = "We have performed variable-temperature multimode quantitative microwave microscopy of in situ epitaxial Ba1-xSrxTiO3 thin-film composition spreads fabricated on (100) LaA1O3 substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO3 to SrTiO3. We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba1-xSrxTiO3 at microwave frequencies.",

author = "Chang, {K. S.} and M. Aronova and O. Famodu and I. Takeuchi and Lofland, {S. E.} and J. Hattrick-Simpers and H. Chang",

year = "2001",

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doi = "10.1063/1.1427438",

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T1 - Multimode quantitative scanning microwave microscopy of insitu grown epitaxial Ba1-xSrxTiO3 composition spreads

AU - Chang, K. S.

AU - Aronova, M.

AU - Famodu, O.

AU - Takeuchi, I.

AU - Lofland, S. E.

AU - Hattrick-Simpers, J.

AU - Chang, H.

PY - 2001/12/24

Y1 - 2001/12/24

N2 - We have performed variable-temperature multimode quantitative microwave microscopy of in situ epitaxial Ba1-xSrxTiO3 thin-film composition spreads fabricated on (100) LaA1O3 substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO3 to SrTiO3. We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba1-xSrxTiO3 at microwave frequencies.

AB - We have performed variable-temperature multimode quantitative microwave microscopy of in situ epitaxial Ba1-xSrxTiO3 thin-film composition spreads fabricated on (100) LaA1O3 substrates. Dielectric properties were mapped as a function of continuously varying composition from BaTiO3 to SrTiO3. We have demonstrated nondestructive temperature-dependent dielectric characterization of local thin-film regions. Measurements are simultaneously taken at multiple resonant frequencies of the microscope cavity. The multimode measurements allow frequency dispersion studies. We observe strong composition-dependent dielectric relaxation in Ba1-xSrxTiO3 at microwave frequencies.

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JF - Applied Physics Letters

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Multimode quantitative scanning microwave microscopy of insitu grown epitaxial Ba_1-xSr_xTiO₃ composition spreads

Abstract

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