Material characteristics of perovskite manganese oxide thin films for bolometric applications

A. Goyal; M. Rajeswari; R. Shreekala; S. E. Lofland; S. M. Bhagat; T. Boettcher; C. Kwon; R. Ramesh; T. Venkatesan

doi:10.1063/1.120427

Material characteristics of perovskite manganese oxide thin films for bolometric applications

A. Goyal, M. Rajeswari, R. Shreekala, S. E. Lofland, S. M. Bhagat, T. Boettcher, C. Kwon, R. Ramesh, T. Venkatesan

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Abstract

We are optimizing thin films of perovskite manganese oxides for bolometric applications. We have studied the relevant material characteristics of several members of this family namely, La_0.7Ba_0.3MnO₃, La_0.7Sr_0.3MnO₃, La_0.7Ca_0.3MnO₃, and Nd_0.7Sr_0.3MnO₃. Here, we discuss issues related to the choice of material, the influence of deposition parameters, and postdeposition heat treatments on the relevant characteristics such as the resistivity-peak temperature (T_p) and the temperature coefficient of resistance (TCR). For a given material, a higher peak temperature implies a larger temperature coefficient of resistance. In contrast, on comparing different material systems, the TCR tends to decrease as T_p, increases.

Original language	English (US)
Pages (from-to)	2535-2537
Number of pages	3
Journal	Applied Physics Letters
Volume	71
Issue number	17
DOIs	https://doi.org/10.1063/1.120427
State	Published - Oct 27 1997
Externally published	Yes

All Science Journal Classification (ASJC) codes

Physics and Astronomy (miscellaneous)

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10.1063/1.120427

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title = "Material characteristics of perovskite manganese oxide thin films for bolometric applications",

abstract = "We are optimizing thin films of perovskite manganese oxides for bolometric applications. We have studied the relevant material characteristics of several members of this family namely, La0.7Ba0.3MnO3, La0.7Sr0.3MnO3, La0.7Ca0.3MnO3, and Nd0.7Sr0.3MnO3. Here, we discuss issues related to the choice of material, the influence of deposition parameters, and postdeposition heat treatments on the relevant characteristics such as the resistivity-peak temperature (Tp) and the temperature coefficient of resistance (TCR). For a given material, a higher peak temperature implies a larger temperature coefficient of resistance. In contrast, on comparing different material systems, the TCR tends to decrease as Tp, increases.",

author = "A. Goyal and M. Rajeswari and R. Shreekala and Lofland, {S. E.} and Bhagat, {S. M.} and T. Boettcher and C. Kwon and R. Ramesh and T. Venkatesan",

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doi = "10.1063/1.120427",

language = "English (US)",

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TY - JOUR

T1 - Material characteristics of perovskite manganese oxide thin films for bolometric applications

AU - Goyal, A.

AU - Rajeswari, M.

AU - Shreekala, R.

AU - Lofland, S. E.

AU - Bhagat, S. M.

AU - Boettcher, T.

AU - Kwon, C.

AU - Ramesh, R.

AU - Venkatesan, T.

PY - 1997/10/27

Y1 - 1997/10/27

N2 - We are optimizing thin films of perovskite manganese oxides for bolometric applications. We have studied the relevant material characteristics of several members of this family namely, La0.7Ba0.3MnO3, La0.7Sr0.3MnO3, La0.7Ca0.3MnO3, and Nd0.7Sr0.3MnO3. Here, we discuss issues related to the choice of material, the influence of deposition parameters, and postdeposition heat treatments on the relevant characteristics such as the resistivity-peak temperature (Tp) and the temperature coefficient of resistance (TCR). For a given material, a higher peak temperature implies a larger temperature coefficient of resistance. In contrast, on comparing different material systems, the TCR tends to decrease as Tp, increases.

AB - We are optimizing thin films of perovskite manganese oxides for bolometric applications. We have studied the relevant material characteristics of several members of this family namely, La0.7Ba0.3MnO3, La0.7Sr0.3MnO3, La0.7Ca0.3MnO3, and Nd0.7Sr0.3MnO3. Here, we discuss issues related to the choice of material, the influence of deposition parameters, and postdeposition heat treatments on the relevant characteristics such as the resistivity-peak temperature (Tp) and the temperature coefficient of resistance (TCR). For a given material, a higher peak temperature implies a larger temperature coefficient of resistance. In contrast, on comparing different material systems, the TCR tends to decrease as Tp, increases.

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EP - 2537

JO - Applied Physics Letters

JF - Applied Physics Letters

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ER -

Material characteristics of perovskite manganese oxide thin films for bolometric applications

Abstract

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