TY - JOUR
T1 - Instrumentation effects on the detection of resistance transients during accelerated testing of VLSI interconnects
AU - Fahrenkrug, Craig C.F.
AU - Head, Linda M.
N1 - Funding Information:
Manuscript received December 19, 1995. This work was supported by National Science Foundation Grant ECS-9309457. C. C. F. Fahrenkrug is with Symtx, Inc., West Endicott, NY 13760 USA (e-mail: [email protected]). L. M. Head is with Rowan University, School of Engineering, Glassboro, NJ 08028 USA(e-mail: [email protected]). Publisher Item Identifier S 0018-9456(00)02225-7.
PY - 2000/8
Y1 - 2000/8
N2 - Some researchers have proposed using noise as an interconnect reliability tool. Often, however, noise spectral density has been used without concurrently examining the fluctuations in the time-domain which generate the noise spectra. Recently, the presence of abrupt changes in resistance (ACR's) has been documented in VLSI interconnects at accelerated stressing conditions. These ACR's are investigated here to identify their impact on typical spectra produced in noise measurements. Three results are reported in this paper. First, the presence of ACR's usually coincides with generation of 1/f2 noise. Second, the location of the ACR in the Fast Fourier Transform window is significant. Third, cross-correlation techniques can be used to identify ACR's in the time-domain signal.
AB - Some researchers have proposed using noise as an interconnect reliability tool. Often, however, noise spectral density has been used without concurrently examining the fluctuations in the time-domain which generate the noise spectra. Recently, the presence of abrupt changes in resistance (ACR's) has been documented in VLSI interconnects at accelerated stressing conditions. These ACR's are investigated here to identify their impact on typical spectra produced in noise measurements. Three results are reported in this paper. First, the presence of ACR's usually coincides with generation of 1/f2 noise. Second, the location of the ACR in the Fast Fourier Transform window is significant. Third, cross-correlation techniques can be used to identify ACR's in the time-domain signal.
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U2 - 10.1109/19.863912
DO - 10.1109/19.863912
M3 - Article
AN - SCOPUS:0034246637
SN - 0018-9456
VL - 49
SP - 716
EP - 720
JO - IEEE Transactions on Instrumentation and Measurement
JF - IEEE Transactions on Instrumentation and Measurement
IS - 4
ER -