@article{7c1bd415d7374e61b91ecbf3df1d30f4,
title = "Indirect Testing of Digital-Correction Circuits in Analog-to-Digital Converters with Redundancy",
abstract = "This paper presents a study of indirect fault testing of digital-correction circuits that operate as a part of analog-to-digital converters with redundancy. Design and test techniques that improve the fault coverage are described. The limitations of these techniques and methods to overcome these limitations are presented.",
author = "Lewis, {Stephen H.} and R. Ramachandran and Snelgrove, {W. Martin}",
note = "Funding Information: Manuscript received June 21, 1993; revised August 30, 1994. This work was supported by AT&T and NSF Grant MIP-9210071. This paper was recommended by Associate Editor V. Gopinathan. S. H. Lewis is with Solid-state Circuits Research Laboratory, Department of Electrical and Computer Engineering, University of California, Davis, CA 95616 USA. R. Ramachandran is with AT&T Bell Laboratories, Allentown, PA 18103 USA. W. M. Snelgrove is with the Department of Electrical Engineering, Carleton University, Ottawa, Cntario, Canada K1S 5B6. IEEE Log Number 9412398.",
year = "1995",
month = jul,
doi = "10.1109/82.401166",
language = "English (US)",
volume = "42",
pages = "437--445",
journal = "IEEE Transactions on Circuits and Systems II: Analog and Digital Signal Processing",
issn = "1057-7130",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
number = "7",
}