TY - GEN
T1 - Increased dielectric strength of polyimide/silicon dioxide nanocomposites at cryogenic temperatures
AU - Cook, Jordan
AU - Hones, Harrison
AU - Xue, Wei
AU - Yu, Lei
AU - Krchnavek, Robert
N1 - Publisher Copyright:
© 2020 IEEE.
PY - 2020/7
Y1 - 2020/7
N2 - Polyimide/silicon dioxide nanocomposites were synthesized and tested dielectrically at both room and cryogenic temperatures. The dielectric strength of the nanocomposites showed significant increase from about 150 kV/mm at room temperature to roughly 300 kV/mm at the cryogenic temperature. This increase in dielectric strength is a result of the contraction of the host polymer around the embedded nanoparticles, which shortens the mean free path of electrons as well as the distance needed for electrons to accelerate to induce avalanche breakdown. The contraction of the host polymer also reduces the overlapping of the transition region, the outermost layer of the multi-core model, between individual nanoparticles. The findings from our experimental results and multi-core model can potentially advance the field of cryogenic dielectrics.
AB - Polyimide/silicon dioxide nanocomposites were synthesized and tested dielectrically at both room and cryogenic temperatures. The dielectric strength of the nanocomposites showed significant increase from about 150 kV/mm at room temperature to roughly 300 kV/mm at the cryogenic temperature. This increase in dielectric strength is a result of the contraction of the host polymer around the embedded nanoparticles, which shortens the mean free path of electrons as well as the distance needed for electrons to accelerate to induce avalanche breakdown. The contraction of the host polymer also reduces the overlapping of the transition region, the outermost layer of the multi-core model, between individual nanoparticles. The findings from our experimental results and multi-core model can potentially advance the field of cryogenic dielectrics.
UR - https://www.scopus.com/pages/publications/85091013573
UR - https://www.scopus.com/pages/publications/85091013573#tab=citedBy
U2 - 10.1109/NANO47656.2020.9183546
DO - 10.1109/NANO47656.2020.9183546
M3 - Conference contribution
AN - SCOPUS:85091013573
T3 - Proceedings of the IEEE Conference on Nanotechnology
SP - 35
EP - 38
BT - NANO 2020 - 20th IEEE International Conference on Nanotechnology, Proceedings
PB - IEEE Computer Society
T2 - 20th IEEE International Conference on Nanotechnology, NANO 2020
Y2 - 29 July 2020 through 31 July 2020
ER -