Identification of grain boundary effects in current-voltage curves of polycrystalline high-Tc superconductors

Jeffrey Hettinger, K. E. Gray, D. J. Miller, D. H. Kim, D. G. Steel, B. R. Washburn, J. Sharping, C. Moreau, M. Eddy, J. E. Tkaczyk, J. DeLuca, J. H. Kang, J. Talvacchio

Research output: Contribution to journalArticle

9 Scopus citations

Abstract

Dissipation and critical current densities in high-Tc superconductors can depend on both intragranular flux creep and intergranular weak links. Separating these effects in polycrystals can be a formidable task. We present current-voltage data which can in some cases identify weak-link behavior, and verify it by using ion irradiation to greatly diminish the contribution from flux creep. We conclude that the occurrence of significant weak links in series with so-called strongly-coupled current paths may be more common than previously deduced.

Original languageEnglish (US)
Pages (from-to)275-280
Number of pages6
JournalPhysica C: Superconductivity and its Applications
Volume273
Issue number3-4
DOIs
StatePublished - Jan 1 1997
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Energy Engineering and Power Technology
  • Electrical and Electronic Engineering

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    Hettinger, J., Gray, K. E., Miller, D. J., Kim, D. H., Steel, D. G., Washburn, B. R., Sharping, J., Moreau, C., Eddy, M., Tkaczyk, J. E., DeLuca, J., Kang, J. H., & Talvacchio, J. (1997). Identification of grain boundary effects in current-voltage curves of polycrystalline high-Tc superconductors. Physica C: Superconductivity and its Applications, 273(3-4), 275-280. https://doi.org/10.1016/S0921-4534(96)00648-X