TY - JOUR
T1 - Heating rate and spin flip lifetime due to near-field noise in layered superconducting atom chips
AU - Fermani, R.
AU - Müller, T.
AU - Zhang, B.
AU - Lim, M. J.
AU - Dumke, R.
PY - 2010
Y1 - 2010
N2 - We investigate theoretically the heating rate and spin flip lifetimes due to near-field noise for atoms trapped close to layered superconducting structures with the superconductor in the Meissner state. In particular, we compare the case of a gold layer deposited above a superconductor with the case of a bare superconductor. We study a niobium-based and a YBa2Cu 3O7 - x (YBCO)-based chip. For both niobium and YBCO chips at a temperature of 4.2 K, we find that the deposition of the gold layer can have a significant impact on the heating rate and spin flip lifetime, as a result of the increase of the near-field noise. At a chip temperature of 77 K, this effect is less pronounced for the YBCO chip.
AB - We investigate theoretically the heating rate and spin flip lifetimes due to near-field noise for atoms trapped close to layered superconducting structures with the superconductor in the Meissner state. In particular, we compare the case of a gold layer deposited above a superconductor with the case of a bare superconductor. We study a niobium-based and a YBa2Cu 3O7 - x (YBCO)-based chip. For both niobium and YBCO chips at a temperature of 4.2 K, we find that the deposition of the gold layer can have a significant impact on the heating rate and spin flip lifetime, as a result of the increase of the near-field noise. At a chip temperature of 77 K, this effect is less pronounced for the YBCO chip.
UR - http://www.scopus.com/inward/record.url?scp=77951629123&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=77951629123&partnerID=8YFLogxK
U2 - 10.1088/0953-4075/43/9/095002
DO - 10.1088/0953-4075/43/9/095002
M3 - Article
AN - SCOPUS:77951629123
SN - 0953-4075
VL - 43
JO - Journal of Physics B: Atomic, Molecular and Optical Physics
JF - Journal of Physics B: Atomic, Molecular and Optical Physics
IS - 9
M1 - 095002
ER -