Growth and properties of La2-xSrxCuO4 films

I. E. Trofimov, L. A. Johnson, K. V. Ramanujachary, S. Guha, M. G. Harrison, M. Greenblatt, M. Z. Cieplak, P. Lindenfeld

Research output: Contribution to journalArticlepeer-review

48 Scopus citations

Abstract

Single-crystalline films of La2-xSrxCuO4 have been grown epitaxially on SrTiO3, NdGaO3, and LaSrAlO4 substrates by laser ablation. We show that record values of the superconducting transition temperature may be achieved by high-pressure annealing in oxygen. The films exhibit values of Tco above 38 K, as well as a linear variation of the resistivity with T and excellent crystal quality.

Original languageEnglish (US)
Pages (from-to)2481-2483
Number of pages3
JournalApplied Physics Letters
Volume65
Issue number19
DOIs
StatePublished - 1994
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy (miscellaneous)

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