Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7

  • J. D. Hettinger
  • , A. G. Swanson
  • , W. J. Skocpol
  • , J. S. Brooks
  • , J. M. Graybeal
  • , P. M. Mankiewich
  • , R. E. Howard
  • , B. L. Straughn
  • , E. G. Burkhardt

Research output: Contribution to journalArticlepeer-review

117 Scopus citations

Abstract

The critical current density Jc(B,T) is measured to 15 T for c-axis-perpendicular expitaxial thin films of YBa2Cu3O7 with Jc(0,77 K) of order 106 A/cm2. Even in the least-favorable perpendicular orientation, critical currents can exceed 5×105 A/cm2 at 20 K in 15-T fields. Thermally activated flux motion (flux creep) is prominently observed, and can in large part explain the magnitude, temperature, and field dependence of the high-field critical currents.

Original languageEnglish (US)
Pages (from-to)2044-2047
Number of pages4
JournalPhysical Review Letters
Volume62
Issue number17
DOIs
StatePublished - 1989
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • General Physics and Astronomy

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