Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7

J. D. Hettinger, A. G. Swanson, W. J. Skocpol, J. S. Brooks, J. M. Graybeal, P. M. Mankiewich, R. E. Howard, B. L. Straughn, E. G. Burkhardt

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Abstract

The critical current density Jc(B,T) is measured to 15 T for c-axis-perpendicular expitaxial thin films of YBa2Cu3O7 with Jc(0,77 K) of order 106 A/cm2. Even in the least-favorable perpendicular orientation, critical currents can exceed 5×105 A/cm2 at 20 K in 15-T fields. Thermally activated flux motion (flux creep) is prominently observed, and can in large part explain the magnitude, temperature, and field dependence of the high-field critical currents.

Original languageEnglish (US)
Pages (from-to)2044-2047
Number of pages4
JournalPhysical Review Letters
Volume62
Issue number17
DOIs
StatePublished - Jan 1 1989

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

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    Hettinger, J. D., Swanson, A. G., Skocpol, W. J., Brooks, J. S., Graybeal, J. M., Mankiewich, P. M., Howard, R. E., Straughn, B. L., & Burkhardt, E. G. (1989). Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7. Physical Review Letters, 62(17), 2044-2047. https://doi.org/10.1103/PhysRevLett.62.2044