Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7

J. D. Hettinger, A. G. Swanson, W. J. Skocpol, J. S. Brooks, J. M. Graybeal, P. M. Mankiewich, R. E. Howard, B. L. Straughn, E. G. Burkhardt

Research output: Contribution to journalArticle

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Abstract

The critical current density Jc(B,T) is measured to 15 T for c-axis-perpendicular expitaxial thin films of YBa2Cu3O7 with Jc(0,77 K) of order 106 A/cm2. Even in the least-favorable perpendicular orientation, critical currents can exceed 5×105 A/cm2 at 20 K in 15-T fields. Thermally activated flux motion (flux creep) is prominently observed, and can in large part explain the magnitude, temperature, and field dependence of the high-field critical currents.

Original languageEnglish (US)
Pages (from-to)2044-2047
Number of pages4
JournalPhysical Review Letters
Volume62
Issue number17
DOIs
StatePublished - Jan 1 1989

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critical current
thin films
temperature distribution
current density
temperature dependence

All Science Journal Classification (ASJC) codes

  • Physics and Astronomy(all)

Cite this

Hettinger, J. D., Swanson, A. G., Skocpol, W. J., Brooks, J. S., Graybeal, J. M., Mankiewich, P. M., ... Burkhardt, E. G. (1989). Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7. Physical Review Letters, 62(17), 2044-2047. https://doi.org/10.1103/PhysRevLett.62.2044
Hettinger, J. D. ; Swanson, A. G. ; Skocpol, W. J. ; Brooks, J. S. ; Graybeal, J. M. ; Mankiewich, P. M. ; Howard, R. E. ; Straughn, B. L. ; Burkhardt, E. G. / Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7. In: Physical Review Letters. 1989 ; Vol. 62, No. 17. pp. 2044-2047.
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Hettinger, JD, Swanson, AG, Skocpol, WJ, Brooks, JS, Graybeal, JM, Mankiewich, PM, Howard, RE, Straughn, BL & Burkhardt, EG 1989, 'Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7', Physical Review Letters, vol. 62, no. 17, pp. 2044-2047. https://doi.org/10.1103/PhysRevLett.62.2044

Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7. / Hettinger, J. D.; Swanson, A. G.; Skocpol, W. J.; Brooks, J. S.; Graybeal, J. M.; Mankiewich, P. M.; Howard, R. E.; Straughn, B. L.; Burkhardt, E. G.

In: Physical Review Letters, Vol. 62, No. 17, 01.01.1989, p. 2044-2047.

Research output: Contribution to journalArticle

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T1 - Flux creep and high-field critical currents in epitaxial thin films of YBa2Cu3O7

AU - Hettinger, J. D.

AU - Swanson, A. G.

AU - Skocpol, W. J.

AU - Brooks, J. S.

AU - Graybeal, J. M.

AU - Mankiewich, P. M.

AU - Howard, R. E.

AU - Straughn, B. L.

AU - Burkhardt, E. G.

PY - 1989/1/1

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AB - The critical current density Jc(B,T) is measured to 15 T for c-axis-perpendicular expitaxial thin films of YBa2Cu3O7 with Jc(0,77 K) of order 106 A/cm2. Even in the least-favorable perpendicular orientation, critical currents can exceed 5×105 A/cm2 at 20 K in 15-T fields. Thermally activated flux motion (flux creep) is prominently observed, and can in large part explain the magnitude, temperature, and field dependence of the high-field critical currents.

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