Finite size effects in microwave loss in colossal magnetoresistance oxides

Q. Q. Shu; S. M. Bhagat; S. E. Lofland; I. O. Troyanchuk

doi:10.1016/S0038-1098(98)00491-8

Finite size effects in microwave loss in colossal magnetoresistance oxides

Q. Q. Shu, S. M. Bhagat, S. E. Lofland, I. O. Troyanchuk

Research output: Contribution to journal › Article › peer-review

12 Scopus citations

Abstract

We present systematic measurements of microwave surface resistance R_s at 10 and 26 GHz of colossal magnetoresistance materials with varying thicknesses. It was found that for samples thicker than the electromagnetic skin depth, R_s is proportional to ρ^1/2. ρ being the resistivity while for thinner samples, R_s varies as ρ ^-1/2. These observations can be understood in terms of a simple model used to describe R_s.

Original language	English (US)
Pages (from-to)	73-76
Number of pages	4
Journal	Solid State Communications
Volume	109
Issue number	2
DOIs	https://doi.org/10.1016/S0038-1098(98)00491-8
State	Published - Dec 14 1998
Externally published	Yes

All Science Journal Classification (ASJC) codes

Chemistry(all)
Condensed Matter Physics
Materials Chemistry

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10.1016/S0038-1098(98)00491-8

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@article{8fd0f1bfbcd348d3bd8b85e3305368e9,

title = "Finite size effects in microwave loss in colossal magnetoresistance oxides",

abstract = "We present systematic measurements of microwave surface resistance Rs at 10 and 26 GHz of colossal magnetoresistance materials with varying thicknesses. It was found that for samples thicker than the electromagnetic skin depth, Rs is proportional to ρ1/2. ρ being the resistivity while for thinner samples, Rs varies as ρ -1/2. These observations can be understood in terms of a simple model used to describe Rs.",

author = "Shu, {Q. Q.} and Bhagat, {S. M.} and Lofland, {S. E.} and Troyanchuk, {I. O.}",

note = "Funding Information: We thank J.F., Mitchell of Argonne National Laboratory for kindly providing the layered perovskite single crystal. Q.Q. Shu thanks the China Scholarship Council for partial support. This work was also supported by NSF MRSEC Grant No. DMR96-32521. ",

year = "1998",

month = dec,

day = "14",

doi = "10.1016/S0038-1098(98)00491-8",

language = "English (US)",

volume = "109",

pages = "73--76",

journal = "Solid State Communications",

issn = "0038-1098",

publisher = "Elsevier Limited",

number = "2",

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TY - JOUR

T1 - Finite size effects in microwave loss in colossal magnetoresistance oxides

AU - Shu, Q. Q.

AU - Bhagat, S. M.

AU - Lofland, S. E.

AU - Troyanchuk, I. O.

N1 - Funding Information: We thank J.F., Mitchell of Argonne National Laboratory for kindly providing the layered perovskite single crystal. Q.Q. Shu thanks the China Scholarship Council for partial support. This work was also supported by NSF MRSEC Grant No. DMR96-32521.

PY - 1998/12/14

Y1 - 1998/12/14

N2 - We present systematic measurements of microwave surface resistance Rs at 10 and 26 GHz of colossal magnetoresistance materials with varying thicknesses. It was found that for samples thicker than the electromagnetic skin depth, Rs is proportional to ρ1/2. ρ being the resistivity while for thinner samples, Rs varies as ρ -1/2. These observations can be understood in terms of a simple model used to describe Rs.

AB - We present systematic measurements of microwave surface resistance Rs at 10 and 26 GHz of colossal magnetoresistance materials with varying thicknesses. It was found that for samples thicker than the electromagnetic skin depth, Rs is proportional to ρ1/2. ρ being the resistivity while for thinner samples, Rs varies as ρ -1/2. These observations can be understood in terms of a simple model used to describe Rs.

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U2 - 10.1016/S0038-1098(98)00491-8

DO - 10.1016/S0038-1098(98)00491-8

M3 - Article

AN - SCOPUS:0346971845

VL - 109

SP - 73

EP - 76

JO - Solid State Communications

JF - Solid State Communications

SN - 0038-1098

IS - 2

ER -

Finite size effects in microwave loss in colossal magnetoresistance oxides

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