Abstract
We present systematic measurements of microwave surface resistance Rs at 10 and 26 GHz of colossal magnetoresistance materials with varying thicknesses. It was found that for samples thicker than the electromagnetic skin depth, Rs is proportional to ρ1/2. ρ being the resistivity while for thinner samples, Rs varies as ρ -1/2. These observations can be understood in terms of a simple model used to describe Rs.
Original language | English (US) |
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Pages (from-to) | 73-76 |
Number of pages | 4 |
Journal | Solid State Communications |
Volume | 109 |
Issue number | 2 |
DOIs | |
State | Published - Dec 14 1998 |
Externally published | Yes |
All Science Journal Classification (ASJC) codes
- Chemistry(all)
- Condensed Matter Physics
- Materials Chemistry