Finite size effects in microwave loss in colossal magnetoresistance oxides

Q. Q. Shu, S. M. Bhagat, S. E. Lofland, I. O. Troyanchuk

Research output: Contribution to journalArticlepeer-review

12 Scopus citations

Abstract

We present systematic measurements of microwave surface resistance Rs at 10 and 26 GHz of colossal magnetoresistance materials with varying thicknesses. It was found that for samples thicker than the electromagnetic skin depth, Rs is proportional to ρ1/2. ρ being the resistivity while for thinner samples, Rs varies as ρ -1/2. These observations can be understood in terms of a simple model used to describe Rs.

Original languageEnglish (US)
Pages (from-to)73-76
Number of pages4
JournalSolid State Communications
Volume109
Issue number2
DOIs
StatePublished - Dec 14 1998
Externally publishedYes

All Science Journal Classification (ASJC) codes

  • Chemistry(all)
  • Condensed Matter Physics
  • Materials Chemistry

Fingerprint

Dive into the research topics of 'Finite size effects in microwave loss in colossal magnetoresistance oxides'. Together they form a unique fingerprint.

Cite this