Exchange bias in thin-film (Co/Pt)3/Cr2O3 multilayers

S. H. Lim, M. Murakami, S. E. Lofland, A. J. Zambano, L. G. Salamanca-Riba, I. Takeuchi

Research output: Contribution to journalArticlepeer-review

31 Scopus citations


We have fabricated exchange-biased Co/Pt layers ((0.3 nm/1.5 nm)×3) on (0 0 1)-oriented Cr2O3 thin films. The multilayered films showed extremely smooth surfaces and interfaces with root mean square roughness of ≈0.3 nm for 10 μm×10 μm area. The Cr2O3 films display sufficient insulation with a relative low leakage current (1.17×10-2 A/cm2 at 380 MV/m) at room temperature which allowed us to apply electric field as high as 77 MV/m. We find that the sign of the exchange bias and the shape of the hysteresis loops of the out-of-plane magnetized Co/Pt layers can be delicately controlled by adjusting the magnetic field cooling process through the Néel temperature of Cr2O3. No clear evidence of the effect of electric field and the electric field cooling was detected on the exchange bias for fields as high as 77 MV/m. We place the upper bound of the shift in exchange bias field due to electric field cooling to be 5 Oe at 250 K.

Original languageEnglish (US)
Pages (from-to)1955-1958
Number of pages4
JournalJournal of Magnetism and Magnetic Materials
Issue number13
StatePublished - Jul 2009

All Science Journal Classification (ASJC) codes

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics


Dive into the research topics of 'Exchange bias in thin-film (Co/Pt)3/Cr2O3 multilayers'. Together they form a unique fingerprint.

Cite this