The role of substrate-induced microstructure on transport properties in c-axis oriented epitaxial Tl2Ba2CaCu20x films grown on LaAlOß and SrTiU3 has been studied. For a magnetic field parallel to the Cu-0 planes, resistivity and the critical current density, Jc, have been measured as a function of angle 6 between the applied field and the direction of transport current. Resistivity dips and enhancement of the critical current density, Jc, were observed for magnetic fields applied parallel to the substrate twins in LaA103 in high fields (> 2 T). Meanwhile for films on SrTi03, resistivity and Jc were Lorentz-force independent.
All Science Journal Classification (ASJC) codes
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Electrical and Electronic Engineering