Characterization of solid oxide fuel cell layers by computed x-ray microtomography and small-angle scattering

A combination of advanced x-ray synchrotron-based research tools is presented that shows promise in providing an improved understanding of how solid oxide fuel cell (SOFC) microstructure and chemistry may be controlled through processing, and how their evolution or degradation during service life changes SOFC performance properties. Results are discussed to show how the representative void microstructures may be characterized and quantified through the anode, electrolyte and cathode layers for generic SOFC systems. Structural phase analysis is also demonstrated for sample volumes closely corresponding to those for which the void microstructures are quantified. This paper both summarizes results and elucidates how continued development of such methods could benefit SOFC design.