Abstract
The use of the atomic force microscope (AFM) to measure surface forces has been developed to optomize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation. In this paper, a novel technique is used to probe local property changes in multi-component polymer systems. Changes in indentation response in interphase regions are investigated for an adhesive system involving a diffuse polymer-polymer bond and for two composite systems. To date, diamond-tipped probes with effective spring constants of 150 and 310 N/m have been used to investigate polyimide and epoxy resin matrices reinforced by carbon fibers.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 313-318 |
| Number of pages | 6 |
| Journal | Materials Research Society Symposium - Proceedings |
| Volume | 458 |
| State | Published - 1997 |
| Externally published | Yes |
| Event | Proceedings of the 1996 MRS Fall Meeting - Boston, MA, USA Duration: Dec 2 1996 → Dec 6 1996 |
All Science Journal Classification (ASJC) codes
- General Materials Science
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering