Characterization of interphase regions using atomic force microscopy

M. R. Vanlandingham, S. H. McKnight, G. R. Palmese, T. A. Bogetti, R. F. Eduljee, J. W. Gillespie

Research output: Contribution to journalConference articlepeer-review

26 Scopus citations


The use of the atomic force microscope (AFM) to measure surface forces has been developed to optomize its operation as a surface imaging tool. This capability can potentially be extended to evaluate nanoscale material response to indentation. In this paper, a novel technique is used to probe local property changes in multi-component polymer systems. Changes in indentation response in interphase regions are investigated for an adhesive system involving a diffuse polymer-polymer bond and for two composite systems. To date, diamond-tipped probes with effective spring constants of 150 and 310 N/m have been used to investigate polyimide and epoxy resin matrices reinforced by carbon fibers.

Original languageEnglish (US)
Pages (from-to)313-318
Number of pages6
JournalMaterials Research Society Symposium - Proceedings
StatePublished - 1997
Externally publishedYes
EventProceedings of the 1996 MRS Fall Meeting - Boston, MA, USA
Duration: Dec 2 1996Dec 6 1996

All Science Journal Classification (ASJC) codes

  • Materials Science(all)
  • Condensed Matter Physics
  • Mechanics of Materials
  • Mechanical Engineering


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