Microstructural studies of TlBa2Ca2Cu 3Ox(Tl-1223) thick films that exhibit high critical current densities (Jc) for nonepitaxial polycrystalline materials show that these films possess a]] brick-wall" structure that may be partly responsible for high current densities. The magnetic field dependence of J c is similar to that reported for Bi-Sr-Ca-Cu-O materials that exhibit this structure. Structural analyses indicate a high degree of c-axis alignment but little in-plane texture, suggesting that high-angle  tilt boundaries are prevalent. Scanning and transmission electron microscopy reveal that the microstructure consists of overlapping layers reminiscent of the brick-wall structure. These results suggest that high critical current densities may be achieved by percolative transport through this structure.
|Original language||English (US)|
|Number of pages||3|
|Journal||Applied Physics Letters|
|State||Published - 1993|
All Science Journal Classification (ASJC) codes
- Physics and Astronomy (miscellaneous)