Black silicon based iris with reduced light scattering and reflection

Yousuf D. Almoallem; Mohammad J. Moghimi; Hongrui Jiang

doi:10.1109/OMN.2017.8051469

Black silicon based iris with reduced light scattering and reflection

Yousuf D. Almoallem, Mohammad J. Moghimi, Hongrui Jiang

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0^th order disk much sharper.

Original language	English (US)
Title of host publication	2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings
Publisher	IEEE Computer Society
ISBN (Electronic)	9781538607374
DOIs	https://doi.org/10.1109/OMN.2017.8051469
State	Published - Sep 26 2017
Externally published	Yes
Event	22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Santa Fe, United States Duration: Aug 13 2017 → Aug 17 2017

Publication series

Name	International Conference on Optical MEMS and Nanophotonics
ISSN (Print)	2160-5033
ISSN (Electronic)	2160-5041

Conference

Conference	22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017
Country/Territory	United States
City	Santa Fe
Period	8/13/17 → 8/17/17

All Science Journal Classification (ASJC) codes

Hardware and Architecture
Electrical and Electronic Engineering
Electronic, Optical and Magnetic Materials

Access to Document

10.1109/OMN.2017.8051469

Cite this

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title = "Black silicon based iris with reduced light scattering and reflection",

abstract = "This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0th order disk much sharper.",

author = "Almoallem, {Yousuf D.} and Moghimi, {Mohammad J.} and Hongrui Jiang",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017 ; Conference date: 13-08-2017 Through 17-08-2017",

year = "2017",

month = sep,

day = "26",

doi = "10.1109/OMN.2017.8051469",

language = "English (US)",

series = "International Conference on Optical MEMS and Nanophotonics",

publisher = "IEEE Computer Society",

booktitle = "2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings",

address = "United States",

}

Almoallem, YD, Moghimi, MJ & Jiang, H 2017, Black silicon based iris with reduced light scattering and reflection. in 2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings., 8051469, International Conference on Optical MEMS and Nanophotonics, IEEE Computer Society, 22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017, Santa Fe, United States, 8/13/17. https://doi.org/10.1109/OMN.2017.8051469

Black silicon based iris with reduced light scattering and reflection. / Almoallem, Yousuf D.; Moghimi, Mohammad J.; Jiang, Hongrui.
2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings. IEEE Computer Society, 2017. 8051469 (International Conference on Optical MEMS and Nanophotonics).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

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AU - Almoallem, Yousuf D.

AU - Moghimi, Mohammad J.

AU - Jiang, Hongrui

PY - 2017/9/26

Y1 - 2017/9/26

N2 - This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0th order disk much sharper.

AB - This paper reports the fabrication and the characterization of a black silicon based iris that shows significant reduction in the unwanted stray light due to scattering and reflection on the iris surfaces. The iris was characterized by recording the far-field diffraction pattern at a 532-nm wavelength. The intensity at dark rings is reduced by a factor of up to 5, which makes the bright 0th order disk much sharper.

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M3 - Conference contribution

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T3 - International Conference on Optical MEMS and Nanophotonics

BT - 2017 International Conference on Optical MEMS and Nanophotonics, OMN 2017 - Proceedings

PB - IEEE Computer Society

T2 - 22nd International Conference on Optical MEMS and Nanophotonics, OMN 2017

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ER -

Black silicon based iris with reduced light scattering and reflection

Abstract

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Conference

All Science Journal Classification (ASJC) codes

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