TY - GEN
T1 - Bayesian Deep Learning Detection of Anomalies and Failure
T2 - 33rd IEEE International Workshop on Machine Learning for Signal Processing, MLSP 2023
AU - Carannante, Giuseppina
AU - Bouaynaya, Nidhal C.
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - Deep learning models trained solely on in-distribution data may not generalize well to anomalous data and may exhibit high confidence in incorrect predictions, leading to significant consequences in safety-critical applications such as medical diagnosis or autonomous driving. It is important for these models to be able to handle anomalous or Out-of-Distribution (OOD) data which are prevalent in many real-world scenarios. In this work, we leverage the predictive variance, i.e., second-order moment of the predictive distribution, of Bayesian models to identify anomalous data points. We test our anomaly and misclassification mechanism on medical image datasets and compare the detection performance of several Bayesian frameworks under various distributional shifts, i.e., noisy conditions, adversarial attacks and OOD data.
AB - Deep learning models trained solely on in-distribution data may not generalize well to anomalous data and may exhibit high confidence in incorrect predictions, leading to significant consequences in safety-critical applications such as medical diagnosis or autonomous driving. It is important for these models to be able to handle anomalous or Out-of-Distribution (OOD) data which are prevalent in many real-world scenarios. In this work, we leverage the predictive variance, i.e., second-order moment of the predictive distribution, of Bayesian models to identify anomalous data points. We test our anomaly and misclassification mechanism on medical image datasets and compare the detection performance of several Bayesian frameworks under various distributional shifts, i.e., noisy conditions, adversarial attacks and OOD data.
UR - http://www.scopus.com/inward/record.url?scp=85177236467&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85177236467&partnerID=8YFLogxK
U2 - 10.1109/MLSP55844.2023.10285922
DO - 10.1109/MLSP55844.2023.10285922
M3 - Conference contribution
AN - SCOPUS:85177236467
T3 - IEEE International Workshop on Machine Learning for Signal Processing, MLSP
BT - Proceedings of the 2023 IEEE 33rd International Workshop on Machine Learning for Signal Processing, MLSP 2023
A2 - Comminiello, Danilo
A2 - Scarpiniti, Michele
PB - IEEE Computer Society
Y2 - 17 September 2023 through 20 September 2023
ER -