A comparative analysis of transistors based on dielectrophoresis-aligned carbon nanotubes (CNTs) and assembled random-network CNTs

Jason L. Juhala, Benjamin W. Griffith, Yan Duan, Wei Xue

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The purpose of this project is to investigate the fabrication and characterization of carbon nanotube (CNT) thin-film transistors (TFTs), based on two solution-based fabrication methods: dielectrophoretic deposition of aligned CNTs and self-assembly of random-network CNTs. The fabrication procedures of the two transistors and their corresponding electrical characteristics are studied comparatively. The electrode design enables repeatable CNT thin-film deposition and results in transistors with comparable structures. Electrodes are fabricated on low-resistivity Si/SiO 2 wafers using lithography and wet etching. The measurement results of these two CNT transistors are compared to determine the differences in electrical characteristics. The results indicate that the self-assembly method produces a stronger field effect. This phenomenon can be further enhanced in future work by decreasing the concentration of metallic CNTs (mCNTs) through a number of different methods.

Original languageEnglish (US)
Title of host publicationTechnical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012
Pages244-247
Number of pages4
StatePublished - Aug 20 2012
EventNanotechnology 2012: Advanced Materials, CNTs, Particles, Films and Composites - 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012 - Santa Clara, CA, United States
Duration: Jun 18 2012Jun 21 2012

Publication series

NameTechnical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012

Other

OtherNanotechnology 2012: Advanced Materials, CNTs, Particles, Films and Composites - 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012
CountryUnited States
CitySanta Clara, CA
Period6/18/126/21/12

All Science Journal Classification (ASJC) codes

  • Ceramics and Composites
  • Surfaces, Coatings and Films

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  • Cite this

    Juhala, J. L., Griffith, B. W., Duan, Y., & Xue, W. (2012). A comparative analysis of transistors based on dielectrophoresis-aligned carbon nanotubes (CNTs) and assembled random-network CNTs. In Technical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012 (pp. 244-247). (Technical Proceedings of the 2012 NSTI Nanotechnology Conference and Expo, NSTI-Nanotech 2012).